Statistical Identification of Uniformly Mutated Segments within Repeats

Sahinalp SC, Eichler EE, Goldberg P, Berenbrink P, Friedetzky T, Ergun F
27 September 2002
Proc. of CPM 2002, 249-261
Presented at CPM’02 (13th Annual Symposium on Combinatorial Pattern Matching), Fukuoka, Japan, July 3-5
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Abstract